Flick Standard - Dynamic Verification of
instruments are normally set up to calibrate probe amplification
statically through known heights most commonly achieved through the
use of gage blocks.
This static approach makes it necessary
to perform a dynamic verification of the frequency response of the
The best method of verification of this
dynamic verification is made through the use of a “Flick” standard.
The “Flick” standard is a cylindrical artifact with a known
nominally flat area.
EMI Gage produces high
precision “Flick” standards that have been calibrated through our
ISO/IEC 17025 certified laboratory.
These “Flick” standards are provided
with a certificate that details the values of the “Flick” with
respect to standard filters and tip radii combinations*.
The calibrated “Flick” allows the user
to easily determine that the roundness measuring gain settings are
The dynamic verification using the “Flick”
standard is rapidly performed and can be implemented into daily
verification protocols allowing the user to have an increased
confidence that the instrument is functioning correctly.
Gage Laboratory Flick Standard Analysis
Calibration of the Flick Standard allows for
analysis of the same artefact under various conditions i.e.
different filter cutoffs and stylus tip radii. This allows the
user to verify that the roundness measuring gain settings are
performing correctly through a simple measurement
*Not affiliated withTaylor-Hobson,
Mahr, Mitutoyo, Zeiss/TSK or any of their affiliates.
See also Terms and